Fatigue Crack Interaction with Residual Stress Fields via TSA and SXRD

This dataset originates from an experimental study investigating fatigue crack growth from cold-expanded holes. The research utilized thermoelastic stress analysis (TSA) and synchrotron x-ray diffraction (SXRD) to measure crack growth rates, crack tip plastic zones, and residual stress distributions. It was authored by Khurram Amjad and published in 2020.

Use Cases

• Analyze crack growth rates as the crack tip moves through the residual stress zone induced by cold expansion.
• Model the relationship between crack tip plastic zone size and the presence of residual compressive stresses from TSA data.
• Validate stress relaxation conclusions by examining residual stress distributions measured along the crack growth direction using SXRD.
• Assess the impact of a single compressive overload on residual stress relaxation and its implications for fatigue life.

Strengths

• Data is derived from two advanced experimental techniques: thermoelastic stress analysis (TSA) and synchrotron x-ray diffraction (SXRD).
• The dataset is associated with a study that provides qualitative fractographic analysis to confirm the influence of residual stresses on crack initiation.
• The dataset is published under a permissive CC0 1.0 license, allowing for broad reuse.

Limitations

• The specific data structure, including row count, column names, and file formats, is unknown, complicating direct analysis.
• As a dataset from a single 2020 study, it represents a specific experimental setup and may not be generalizable to other materials or conditions.
• The dataset's size and sample data are unavailable, making it difficult to assess its statistical scope or perform computational validation.

Provenance

Source

Dryad digital repository.

Collection Method

Experimental data collected using thermoelastic stress analysis (TSA) and synchrotron x-ray diffraction (SXRD) techniques.

Freshness

Last updated on 2020-06-24.