InGaN/GaN Core-Shell Nanorods with SEM, TEM, and EDX Measurements

University of Bath researcher Emmanuel Le Boulbar created this dataset from scanning electron microscopy (SEM), transmission electron microscopy (TEM), and Energy Dispersive X-ray (EDX) measurements on InGaN/GaN core-shell nanostructures. The data likely contains images and compositional measurements from highly regular arrays of nanorods grown using metal organic vapour phase epitaxy (MOVPE) at three different temperatures: 750°C, 700°C, and 650°C.

Use Cases

• Correlating nanorod morphology with growth temperature based on SEM images
• Investigating structural properties and InGaN layer thickness based on TEM measurements
• Assessing homogeneity of InGaN layer composition based on EDX measurements across different facet positions

Strengths

• Includes measurements from three distinct growth temperatures (750°C, 700°C, and 650°C), enabling comparative analysis
• Combines multiple characterization techniques (SEM, TEM, EDX) for a multi-faceted view of the nanostructures

Limitations

• Column-level documentation is absent; field semantics must be inferred after download
• Row count is unknown, which may limit suitability assessment
• Last update date is unknown; freshness unverified

Provenance

Source

University of Bath

Collection Method

Scanning electron microscopy (SEM), transmission electron microscopy (TEM), and Energy Dispersive X-ray (EDX) measurements on fabricated nanostructures.