Loading...
Loading...
Available on 1 platform
Sign in to view source links and access this dataset
A benchmark collection of large-scale defect datasets designed for industrial inspection research. The dataset was created by DefectSpectrum and published in October 2023, with a repository update in October 2024. It provides granular, semantically rich image data for advancing defect inspection applications.
License is indicated as 'mit' in platform tags. The dataset is stored in an image folder structure, which may require specific loading libraries for processing.