EBSD Measurements of Surfalex HF (AA6016A) Aluminium Alloy

Electron backscatter diffraction (EBSD) measurements of Surfalex HF (AA6016A), an aluminium alloy used in automotive applications. The data was collected by Sumeet Mishra at the University of Manchester using an FEI Sirion field emission gun scanning electron microscope with a Nordlys detector. Scans were performed on three different planes (RD-TD, RD-ND, TD-ND) with an acceleration voltage of 20 kV, a working distance of 16 mm, and a step size of 2 μm.

Use Cases

• Analyze grain texture and orientation based on EBSD scans across multiple planes.
• Study the effects of specific sample preparation steps (grinding, diamond polishing, colloidal silica, electropolishing) on surface quality for EBSD.
• Model microstructure-property relationships in AA6016A aluminium alloy based on crystallographic data.
• Validate EBSD measurement protocols using the described instrument parameters (20 kV, 16 mm working distance, 2 μm step size).

Strengths

• Detailed description of the measurement methodology, including specific instrument parameters like a 20 kV acceleration voltage and 2 μm step size.
• Comprehensive documentation of the multi-stage sample preparation process, from 600-4000 grit grinding to final electropolishing at -15°C.
• Scans were performed on three orthogonal planes (RD-TD, RD-ND, TD-ND), which likely provides a three-dimensional perspective on texture.

Limitations

• Row count, file formats, and column-level documentation are unknown, which limits suitability assessment.
• Last update date is unknown; freshness unverified.
• The dataset's scale and specific data structure require manual inspection after download.

Provenance

Source

Sumeet Mishra, University of Manchester

Collection Method

Data was gathered using an FEI Sirion field emission gun scanning electron microscope equipped with a Nordlys detector from Oxford Instruments.