III-V Nanowire Localization on Silicon: AFM and SEM Data with Simulation Codes

Raw AFM data files, SEM images, and simulation codes related to the localization of self-catalyzed III-V nanowires on silicon substrates. The data was contributed by Jelena Vukajlovic-Plestina of École Polytechnique Fédérale de Lausanne and is available under an Open Access (green) license. The specific volume of data and its creation date are not detailed in the provided metadata.

Use Cases

• Training computer vision models for nanowire detection and characterization based on the provided SEM images.
• Calibrating or validating physical simulation models of nanowire growth using the included simulation codes.
• Analyzing surface topography and nanowire dimensions from the raw AFM data files.

Strengths

• Includes raw experimental data (AFM and SEM files), which allows for direct analysis and reprocessing.
• Contains associated simulation codes, potentially enabling reproduction and extension of the research work.
• Originates from a recognized research institution (École Polytechnique Fédérale de Lausanne).

Limitations

• Description metadata is limited; actual data quality requires manual inspection after download.
• Row count and file size are unknown, which may limit suitability assessment.
• Column-level documentation is absent; field semantics must be inferred after download.

Provenance

Source

Jelena Vukajlovic-Plestina, École Polytechnique Fédérale de Lausanne

Collection Method

Likely generated from atomic force microscopy (AFM), scanning electron microscopy (SEM), and computational simulations.