Dielectric Measurements for Aluminum and Antimony Oxide Thin Films

Dielectric measurements for aluminum oxide and antimony oxide thin films synthesized by pulsed laser deposition. The dataset includes capacitance and loss tangent measurements across a range of temperatures, with AC frequency as the independent variable. It was authored by Ruey Jinq Ong and last updated in May 2026.

Use Cases

• Modeling dielectric constant (κ) based on capacitance and loss tangent measurements
• Analyzing temperature-dependent dielectric behavior based on measurements across a temperature range
• Comparing material performance between aluminum oxide and antimony oxide thin films

Strengths

• Includes measurements for two distinct oxide materials (aluminum oxide and antimony oxide)
• Contains dielectric measurements acquired over a range of temperatures

Limitations

• Column-level documentation is absent; field semantics must be inferred after download
• Row count is unknown, which may limit suitability assessment

Provenance

Source

figshare

Collection Method

Likely gathered via laboratory measurements from pulsed laser deposition synthesis.

Freshness

Last updated 2026-05-26 02:05:48; freshness should be verified