IGBT Accelerated Aging: NASA Prognostics Data for Power Electronics

NASA's Prognostics Center of Excellence collected experimental data from accelerated thermal aging tests on Insulated Gate Bipolar Transistors (IGBTs). The dataset is intended for research in fault detection and remaining useful life prediction for power electronics. It was uploaded to the Hugging Face platform by user hmnshudhmn24.

Use Cases

• Train fault detection models based on sensor data from transistors under thermal stress.
• Develop remaining useful life (RUL) prediction algorithms using accelerated aging test results.
• Research power electronics reliability under various thermal stress conditions mentioned in the description.

Strengths

• Data originates from NASA's Prognostics Center of Excellence, a recognized authority in the field.
• The dataset is explicitly designed for prognostics tasks like fault detection and RUL prediction.

Limitations

• Column-level documentation is absent; field semantics must be inferred after download.
• Row count is unknown, which may limit suitability assessment.
• Description metadata is limited; actual data quality requires manual inspection after download.

Provenance

Source

NASA Prognostics Center of Excellence

Collection Method

Experimental data from accelerated thermal aging tests.

Freshness

Last updated 2026-06-27 07:43:31; freshness should be verified.