RHEED Image Luminance Histograms for In/Si(111) Deposition Process Analysis

Asako Yoshinari's dataset on figshare, last updated May 8, 2026, contains video data (11.7 MB) for analyzing Reflection High-Energy Electron Diffraction (RHEED) images. The data supports a proposed method that reinterprets RHEED patterns as spectral luminance histograms for high-throughput peak fitting. This framework is designed for robust, real-time monitoring of structural phase transitions during material fabrication processes like molecular beam epitaxy.

Use Cases

• Training ML models for automatic phase transition detection based on luminance histogram features.
• Developing real-time, image-misalignment-resistant monitoring systems for physical vapor deposition.
• Estimating optimal deposition parameters for fabricating surface superstructures.
• Benchmarking high-throughput spectral analysis techniques for electron diffraction patterns.

Strengths

• The method described is noted for its robustness to image misalignment, a stated problem in the field.
• The dataset is associated with a specific, described application to indium deposition on a Si(111) surface.
• The file is provided under a permissive CC-BY-4.0 license, allowing for broad reuse.

Limitations

• The dataset size is 11.7 MB, which is relatively small and may limit the scope of analysis.
• Column-level documentation and sample data are unavailable, making field semantics and structure unclear.
• Row count is unknown, which may limit suitability assessment for large-scale model training.

Provenance

Source

figshare, author Asako Yoshinari.

Collection Method

Likely generated from experimental RHEED imaging during indium deposition processes.

Freshness

Last updated 2026-05-08 13:40:04