Magnetic and XPS Profiles for Reduction-Formed Europium Oxide Films

Experimental data profiles magnetic and material properties of PIC-compatible europium oxide thin films deposited via reductive sputtering. The dataset, approximately 8.66 MB in size, contains measurements from vibrating sample magnetometry and depth profiling X-ray photoelectron spectroscopy. Mark De Quidt of Cardiff University authored this research, which was last updated on March 24, 2026.

Use Cases

• Analyzing the relationship between deposition conditions (580°C continuous, 580°C with venting, room temperature) and resulting magnetic properties like coercivity.
• Modeling the ferromagnetic transition behavior by examining data points around the Curie temperature of 69K.
• Correlating XPS depth profile data with magnetic measurements to understand film composition and its effect on ferromagnetism.
• Benchmarking soft ferromagnetic EuO film performance for potential applications in optical modulation and isolation within photonic circuits.

Strengths

• Includes specific, low coercivity values as low as 59.3 Oe, indicating soft ferromagnetic behavior.
• Provides material characterization from two established techniques: vibrating sample magnetometry and X-ray photoelectron spectroscopy.
• Dataset is openly licensed under CC-BY-4.0, facilitating reuse and citation.

Limitations

• The exact row count and column names are not provided by any source, limiting precise understanding of the data structure.
• Primary measurements are conducted at cryogenic temperatures due to the low Curie temperature (69K), limiting direct room-temperature analysis.

Provenance

Source

Cardiff University

Collection Method

Data gathered via vibrating sample magnetometry and depth profiling X-ray photoelectron spectroscopy on thin films deposited by reductive sputtering.

Time Range

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Freshness

2026-03-24 16:20:20

Geography

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