Nano-Delta-Bismuth Oxide Impedance, XRD, and SEM Data from HP-HT Treatment

A 1.4 MB zip file contains raw data from high-pressure, high-temperature treatment experiments on nano-delta-bismuth oxide. The data includes impedance spectroscopy, x-ray diffraction, and scanning electron microscopy images, authored by Aleksander Szpakiewicz-Szatan and last updated on May 22, 2026. The dataset is shared under a CC-BY-4.0 license on the figshare platform.

Use Cases

• Analyze electrical conductivity and dielectric properties based on impedance spectroscopy data.
• Characterize crystal structure and phase composition based on x-ray diffraction patterns.
• Study material morphology and particle size based on scanning electron microscopy images.
• Correlate structural changes with electrical performance under high-pressure, high-temperature conditions.

Strengths

• Dataset includes three complementary data types: impedance spectroscopy, x-ray diffraction, and SEM images.
• A readme.txt file is included to provide additional explanation for the data.
• The dataset is relatively small at 1.4 MB, facilitating quick download and inspection.

Limitations

• Row count and column-level documentation are absent, requiring manual inspection after download.
• The description metadata is limited, providing no details on experimental parameters or sample specifics.

Provenance

Source

figshare

Collection Method

Data likely originates from laboratory experiments involving high-pressure, high-temperature treatment.

Freshness

Last updated 2026-05-22 08:45:05; freshness should be verified.