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Over two thousand electromagnetic simulations model optical scattering from periodic line arrays with a 300 nm pitch. The dataset also includes angle-resolved optical measurements with uncertainties for nine physical arrays that differ in dimensions. Data is formatted for use with the Model-Based Optical Metrology in R (MoR) software.
Data is formatted for the MoR software; users intending to use other tools may need to preprocess the files. The dataset is under a specified 'other' license, and commercial material identifications are not endorsements by NIST.