Tabulated Results for Gate Length Scaling of a Scaled NSFET Device

5.5 KB of tabulated results for the gate length scaling of a scaled nanosheet field-effect transistor (NSFET) device. The dataset is provided in an XLS file format and was authored by Shubham. It was last updated on May 26, 2026.

Use Cases

• Analyze transistor performance scaling based on gate length variation
• Model device characteristics based on tabulated electrical results
• Benchmark nanosheet FET designs against scaling metrics

Strengths

• Data is openly available under a CC-BY-4.0 license
• File size is 5.5 KB, indicating a focused and manageable dataset

Limitations

• Description metadata is limited; actual data quality requires manual inspection after download
• Column-level documentation is absent; field semantics must be inferred after download
• Row count is unknown, which may limit suitability assessment

Provenance

Source

figshare

Freshness

Last updated 2026-05-26 17:26:51; freshness should be verified