Point Defects in WSi2N4 and MoSi2N4 Monolayers

Images relative to OM, STM, AFM, TEM, and STEM microscopy techniques. Jinmeng Tong published this dataset on figshare in May 2026. The dataset is a 150.5 MB collection of microscopy images.

Use Cases

• Analyzing defect structures in monolayer materials using microscopy images (inferred from domain, verify after download)
• Benchmarking computational models of material defects against experimental images (inferred from domain, verify after download)
• Training image segmentation models to identify defect types in microscopy data (inferred from domain, verify after download)

Strengths

• Published on figshare under the CC-BY-4.0 license
• Dataset size is 150.5 MB

Limitations

• Metadata is minimal; actual content requires verification after download
• Column-level documentation is absent; field semantics must be inferred after download
• Row count is unknown, which may limit suitability assessment

Provenance

Source

Jinmeng Tong

Freshness

Last updated 2026-05-14 07:03:57