Protected ultrathin cuprous oxide film for photocatalysis: Excitation and relaxation dynam

Experimental data from angle-resolved photoemission spectroscopy and low-energy electron diffraction measurements on a cuprous oxide film. The dataset includes raw and processed spectra files from proprietary and open-source analysis software, such as Igor Pro and SpecsLab Prodigy. Jan Beckord from the University of Zurich authored the associated research paper.

Use Cases

• Analyzing electronic band structure based on angle-resolved photoemission spectroscopy (ARPES) data.
• Studying surface crystallography and ordering based on low-energy electron diffraction (LEED) images.
• Modeling excitation and relaxation dynamics in photocatalysts using time-resolved spectral data.
• Comparing electronic properties of different material systems (e.g., h-BN/Cu(111) vs. h-BN/Cu2O/Cu(111)) using the provided spectra.

Strengths

• Data includes multiple complementary measurement techniques (ARPES and LEED).
• Raw data files are provided in human-readable text formats (*.itx, *.plsp) alongside proprietary formats.
• Measurement parameters are documented within the data files.

Limitations

• Column-level documentation is absent; field semantics must be inferred after download.
• Row count is unknown, which may limit suitability assessment.
• Last update date is unknown; freshness unverified.

Provenance

Source

University of Zurich

Collection Method

Experimental measurements using VG ESCALAB 220 and SPECS Phoibos 150 WAL hemispherical analyzers, a helium lamp, and an SBIG STF-8300 CCD camera.