Large-Scale Embedded Device Vulnerability Scan Results

Scan results from a large-scale infrastructure monitoring the Internet for vulnerable embedded devices over one year. The scanner identified over 1.1 million publicly accessible trivially vulnerable devices. This data was collected by Ang Cui of Columbia University to provide a quantitative understanding of embedded device insecurity.

Use Cases

• Analyzing the prevalence of trivially vulnerable embedded devices based on large-scale Internet scan results.
• Studying the technical and operational challenges of large-scale vulnerability scanning infrastructure.
• Quantifying embedded device insecurity to move beyond anecdotal evidence.

Strengths

• Data is derived from scanning large portions of the Internet, suggesting broad coverage.
• The scanner identified over 1.1 million vulnerable devices, providing a substantial sample size.
• The methodology was developed and refined over a one-year period.

Limitations

• Column-level documentation is absent; field semantics must be inferred after download.
• Row count is unknown, which may limit suitability assessment.
• Last update date is unknown; freshness unverified.

Provenance

Source

Columbia University

Collection Method

Large-scale embedded device vulnerability scanner infrastructure monitoring the Internet.

Time Range

Data collected over a one-year period.

Geography

Large portions of the Internet; specific geographic coverage is not detailed.