Table S1: X-Ray Reflectivity Fitting Parameters for PVP Thin Films

Uncertainties in fitting parameters obtained from fitting X-ray reflectivity data collected at room temperature for dry and water-swollen thin films of PVP on silicon wafers. The dataset includes scattering length density, film thickness, and interfacial widths. It is a 136.4 KB PDF file authored by Benjamin Ferko and last updated on 2026-04 14.

Use Cases

• Quantify uncertainty in material parameters based on scattering length density and film thickness.
• Compare film structure under different humidity conditions based on dry and water-swollen film data.
• Model interfacial roughness based on the substrate and surface interfacial width parameters.

Strengths

• Data includes specific physical parameters: scattering length density (ρ), film thickness (l), and interfacial widths.
• Dataset is openly licensed under CC-BY-4.0.
• Last updated date is explicitly provided: 2026-04-14.

Limitations

• Row count is unknown, which may limit suitability assessment.
• Column-level documentation is absent; field semantics must be inferred after download.
• Dataset is very small at 136.4 KB, indicating limited scope.

Provenance

Source

figshare

Collection Method

Parameters obtained from fitting X-ray reflectivity data.

Time Range

Data collected at room temperature.

Freshness

Last updated 2026-04-14 12:08:58; freshness should be verified.

Geography

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