Loading...
Loading...
Available on 1 platform
Sign in to view source links and access this dataset
National Aeronautics and Space Administration research on prognostics for electronics components in avionics systems. The data likely contains measurements from accelerated aging tests on Isolated Gate Bipolar Transistors (IGBTs), including steady-state voltages and currents, electrical transients, and thermal transients. The dataset was last updated on March 5, -2026.
File format is PDF, which may require extraction or manual processing to access structured data.