X-ray Diffraction Pairs for Noise Filtering Algorithm Training
by Jens Oppliger / University of Zurich
Available on 1 platform
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Description
Jens Oppliger's dataset from the University of Zurich provides paired low- and high-counting X-ray diffraction frames for training noise filtering algorithms. The data was recorded on a La1.88Sr0.12CuO4 single crystal at the PETRA III storage ring at DESY in Hamburg, using a Dectris Pilatus 100K CdTe detector with 100 keV photons and the sample cooled to ~30 K. It contains sequences of 41 consecutive frames per scan, representing signals like 2D charge density wave order, Bragg peaks, powder lines, spurions, and dead pixels.
Use Cases
Training neural networks for experimental noise reduction based on paired low/high-count image sequences.
Benchmarking denoising algorithms on real X-ray diffraction data containing mixed signals like Bragg peaks and charge density waves.
Studying the characteristics of noise in synchrotron-based diffraction measurements from the specified detector and beamline setup.
Strengths
Contains more than 200 groups of paired low- and high-counting statistics, providing a substantial basis for supervised learning.
Includes detailed experimental metadata such as sampling times, monitor values, and specific detector and beamline conditions.
Data is structured into training, validation, and test sets, with the test set including pre-processed denoised frames from a neural network.
Limitations
Conflicting exposure times are reported across sources (1s/20s vs. 2s/21s for low/high counts), creating uncertainty about precise acquisition parameters.
Key metadata such as total row count, file size, and last update date are missing from all platform entries.
The dataset is highly specific to a single material and experimental setup, limiting generalizability to other systems.
Provenance
Source
University of Zurich; data recorded at beamline P21.1, PETRA III storage ring, DESY, Hamburg, Germany.
Collection Method
Experimental measurement using a Dectris Pilatus 100K CdTe detector on a La1.88Sr0.12CuO4 single crystal.
Geography
Hamburg, Germany (experimental site).
License is listed as 'Open Access (green)' but specific terms are not detailed. Data is provided in HDF5 format.