Shear Bond Strength and Contact Angle Data for Sputtered Silicon Oxide Thin Films

Laura Lara's dataset provides raw shear bond strength values and contact angle measurements for sputtered silicon oxide thin films used in zirconia-resin bonding experiments. The 61.0 MB XLSX file contains sputtering conditions and data supporting reproducibility for statistical analyses and figures. It was last updated on 2026-04-17.

Use Cases

• Modeling the relationship between sputtering conditions and bond strength based on experimental parameters.
• Analyzing surface wettability effects on bonding based on contact angle measurements.
• Reproducing statistical analyses and figures from the associated manuscript using the raw data.

Strengths

• Data supports full reproducibility of statistical analyses and figures as stated in the description.
• Includes three specific data types: shear bond strength, contact angle measurements, and sputtering conditions.
• Published under a permissive CC-BY-4.0 license, allowing reuse with attribution.

Limitations

• Column-level documentation is absent; field semantics must be inferred after download.
• Row count is unknown, which may limit suitability assessment.
• Description metadata is limited; actual data quality requires manual inspection after download.

Provenance

Source

Laura Lara via figshare.

Collection Method

Experimental data collected for a manuscript on zirconia-resin bonding.

Time Range

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Freshness

Last updated 2026-04-17 23:18:47.

Geography

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