Direct Measurement of Oxygen Mass Transport at the Nanoscale

CERN and the European Commission published this dataset on 2024-07-18. It contains secondary ion mass spectrometry (SIMS) data for 18O concentration, atom probe tomography (APT) data for 18O fraction, and transmission electron microscopy (TEM) data, all focused on thin films of lanthanum chromite.

Use Cases

• Model oxygen diffusion in nanocrystalline materials based on SIMS concentration profiles.
• Correlate nanoscale structural features from TEM images with oxygen transport properties.
• Validate atom probe tomography analysis of isotopic fractionation in thin film oxides.

Strengths

• Data originates from CERN and the European Commission, authoritative research institutions.
• Includes data from three distinct analytical techniques (SIMS, APT, TEM) for cross-validation.
• Published under the permissive CC-BY-4.0 license for open use.

Limitations

• Column-level documentation is absent; field semantics must be inferred after download.
• Row count is unknown, which may limit suitability assessment.

Provenance

Source

CERN - European Organization for Nuclear Research and European Commission

Collection Method

Data was gathered via secondary ion mass spectrometry (SIMS), atom probe tomography (APT), and transmission electron microscopy (TEM).

Freshness

Last updated 2024-07-18 00:00:00; freshness should be verified.